Gallium Nitride (GaN) wafers

Compare

Description

P-GaN/N-GaN on Sapphire Specifications:

  • Growth method :MOCVD/HVPE
  • Conductivity : P-type/N+-type
  • Dopant : Mg/Si
  • GaN Thickness : 1-5 µm / 500nm-100 µm
  • Concentration :>5E17 cm-3 / >1E18 cm-3
  • Resistivity : < 0.05 Ohm-cm
  • Surface :One side polished (SSP) / Double sides polished (DSP)
  • Substrate Diameter :2’’/3’’/4’’ Sapphire wafer

Reviews

There are no reviews yet.

Be the first to review “Gallium Nitride (GaN) wafers”

Your email address will not be published. Required fields are marked *